Contemporary methods of surface analysis in the study of glass

Journal Article · Fri Nov 01 04:00:00 EST 1985 · Sov. J. Glass Phys. Chem.; (United States)

OSTI ID:5699318

Milovanov, A P; Moiseev, V V; Portnyagin, V I

The surface state of a glass, its structure, and its composition determine many mechanical and physicochemical properties of the glass. This paper examines the common methods in electron- and ion-spectroscopy for analyzing the surface of glass. The X-ray photoelectron spectroscopy method (XPS) or the electron spectroscopy for chemical analysis (ESCA) method is based on the irradiation of a specimen by photons followed by the recording of the secondary photoelectrons. Another method described is Auger electron spectroscopy (AES) based on the effect discovered by P. Auger in 1925. The secondary-ion mass spectroscopy (SIMS) method is a third method and is based on the mass-spectroscopy recording of ions emitted from the surface of a specimen bombarded by a beam of primary ions at a fairly high energy (units of keV). Also described is the ion etching method. The range of application of the surface-analysis methods described to study glass are broad and the authors briefly consider the experimental results obtained in the most important fields of application of these methods. In addition to the purely element analysis, electron spectroscopic methods of studying the surface make it possible to study the crystal and electron structure of the surface of a solid.

• Research Organization: I.V. Grebenshchikov Institute of Silicate Chemistry, Academy of Sciences of the USSR, Leningrad
• OSTI ID: 5699318
• Journal Information: Sov. J. Glass Phys. Chem.; (United States), Journal Name: Sov. J. Glass Phys. Chem.; (United States) Vol. 11:1; ISSN SJGCD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
360603 -- Materials-- Properties
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104 -- Spectral Procedures-- (-1987)
AUGER ELECTRON SPECTROSCOPY
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CHEMICAL SHIFT
CRYSTAL STRUCTURE
DOCUMENT TYPES
ELECTRON SPECTROSCOPY
ELECTRONIC STRUCTURE
ETCHING
GLASS
ION MICROPROBE ANALYSIS
ION SPECTROSCOPY
MASS SPECTROSCOPY
MICROANALYSIS
NONDESTRUCTIVE ANALYSIS
PHOTOELECTRON SPECTROSCOPY
REVIEWS
SPECTROSCOPY
STRUCTURAL CHEMICAL ANALYSIS
SURFACE FINISHING
SURFACE PROPERTIES
X-RAY SPECTROSCOPY