Surface analysis techniques and their use in pollution detection and measurement
Surface analysis techniques such as Auger electron spectroscopy (AES), electron spectroscopy for chemical analysis (ESCA), secondary ion mass spectrometry (SIMS), and ion scattering spectrometry (ISS) are reviewed. The advantages and limitations of these methods are compared with bulk analysis techniques such as x-ray fluorescence spectroscopy, atomic absorption and emission spectroscopy, gas chromatography, and neutron activation analysis. Results otained using ESCA, AES, SIMS, ISS, and x-ray fluorescence analysis from automobile exhaust, laboratory-prepared samples, clean air, and biological samples are discussed. Possible future areas of research using surface techniques are discussed. 16 figures, 1 table.
- Research Organization:
- Brookhaven National Lab., Upton, NY (USA)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- EY-76-C-02-0016
- OSTI ID:
- 6462919
- Report Number(s):
- BNL-25206; CONF-781150-3
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
400100* -- Analytical & Separations Chemistry
AEROSOLS
AIR POLLUTION
AUGER ELECTRON SPECTROSCOPY
BIOLOGICAL MATERIALS
CHEMICAL ANALYSIS
COLLOIDS
COMPARATIVE EVALUATIONS
DISPERSIONS
ELECTRON SPECTROSCOPY
EXHAUST GASES
GASEOUS WASTES
ION MICROPROBE ANALYSIS
ION SCATTERING ANALYSIS
MASS SPECTROSCOPY
NONDESTRUCTIVE ANALYSIS
POLLUTION
SOLS
SPECTROSCOPY
SURFACES
USES
WASTES