Sputter-induced erosion of alkali metal surfaces - AES, XPS and SIMS studies
Conference
·
OSTI ID:6369608
This paper will discuss the manner in which the techniques of Auger-electron spectroscopy (AES), X-ray-photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS) and ion-scattering spectroscopy (ISS) may be used to study the use of high secondary-ion-yield surfaces as a means of reducing plasma-impurity influx in magnetic-confinement fusion devices.
- Research Organization:
- Argonne National Lab., IL (USA)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 6369608
- Report Number(s):
- CONF-821045-3; ON: DE83007720
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700104* -- Fusion Energy-- Plasma Research-- Plasma Kinetics-Experimental-- (-1987)
ALKALI METALS
AUGER ELECTRON SPECTROSCOPY
CHARGED PARTICLES
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
EROSION
IMPURITIES
IONS
MASS SPECTROSCOPY
METALS
PLASMA
SCATTERING
SECONDARY EMISSION
SPECTROSCOPY
SPUTTERING
700104* -- Fusion Energy-- Plasma Research-- Plasma Kinetics-Experimental-- (-1987)
ALKALI METALS
AUGER ELECTRON SPECTROSCOPY
CHARGED PARTICLES
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
EROSION
IMPURITIES
IONS
MASS SPECTROSCOPY
METALS
PLASMA
SCATTERING
SECONDARY EMISSION
SPECTROSCOPY
SPUTTERING