Utilization of synchrotron radiation for trace-element analyses in toxicology of metals

Conference · Sat Jan 01 04:00:00 EST 1983

OSTI ID:5695116

Hanson, A L; Jones, K W; Kraner, H W; Gordon, B M; Chen, J R

The use of SXRF will nicely complement other more widely used analytical techniques for trace elements. The experiments at CHESS showed minimum detectable limits for 1-mm thick organic matrices with monochromated photon beams to be on the order of 160 to 300 ppB for Ni to Sr with minimal structural damage to the material being irradiated. Extrapolations to operating conditions at the NSLS, with a facility designed for XRF, indicate the MDL limits of 10 to 100 ppB should be achievable. The utilization of wavelength dispersive detectors should gain an order of magnitude in sensitivity, but with trade-off of some flexibility in multielemental analyses.

• Research Organization: Brookhaven National Lab., Upton, NY (USA); State Univ. of New York, Geneseo (USA). Coll. of Arts and Sciences
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5695116
• Report Number(s): BNL-33371; CONF-830791-1; ON: DE83016374
• Country of Publication: United States
• Language: English

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