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U.S. Department of Energy
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Formation of optical waveguides by ion implantation

Technical Report ·
OSTI ID:5681069
The use of ion implantation to introduce Ti into LiNbO/sub 3/ for the production of optical waveguides offers several advantages over the use of thermal diffusion. Higher concentrations and steeper gradients of dopant can be obtained, while reducing processing times and temperatures. However, the implantation process amorphizes the substrate, which must be regrown by solid phase epitaxy. This epitaxy was found to be extremely sensitive to the dopant species and concentration, which led to a search for species with better annealing characteristics. Though Ag and Pb allow regrowth at lower temperatures, the tendency of Ti to oxidize during regrowth is essential for the retention of dopant during annealing. Thus, the dopant exhibiting the slowest epitaxial regrowth ultimately produces the best waveguides.
Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5681069
Report Number(s):
DOE/OR/21400-T325; ON: DE88003894
Country of Publication:
United States
Language:
English