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Ultralong minority-carrier lifetime epitaxial GaAs by photon recycling

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.101713· OSTI ID:5650138
; ;  [1]; ; ;  [2]; ;  [3]
  1. Solar Energy Research Institute, Golden, Colorado 80401 (US)
  2. Spire Corporation, Bedford, Massachusetts 01730
  3. Department of Electrical and Computer Engineering, University of Colorado, Boulder, Colorado 80303
The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of photon recycling or self-generation of the self-absorbed radiation.
OSTI ID:
5650138
Journal Information:
Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 55:11; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English