Computer simulation of high resolution transmission electron micrographs: theory and analysis
Computer simulation of electron micrographs is an invaluable aid in their proper interpretation and in defining optimum conditions for obtaining images experimentally. Since modern instruments are capable of atomic resolution, simulation techniques employing high precision are required. This thesis makes contributions to four specific areas of this field. First, the validity of a new method for simulating high resolution electron microscope images has been critically examined. Second, three different methods for computing scattering amplitudes in High Resolution Transmission Electron Microscopy (HRTEM) have been investigated as to their ability to include upper Laue layer (ULL) interaction. Third, a new method for computing scattering amplitudes in high resolution transmission electron microscopy has been examined. Fourth, the effect of a surface layer of amorphous silicon dioxide on images of crystalline silicon has been investigated for a range of crystal thicknesses varying from zero to 2 1/2 times that of the surface layer.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA); California Univ., Berkeley (USA). Dept. of Physics
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5649044
- Report Number(s):
- LBL-19058; ON: DE85013927
- Country of Publication:
- United States
- Language:
- English
Similar Records
Ab initio transmission electron microscopy image simulations of coherent Ag-MgO interfaces
Nanoscale deformation analysis with high-resolution transmission electron microscopy and digital image correlation
Related Subjects
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
AMPLITUDES
COMPUTERIZED SIMULATION
ELECTRON MICROSCOPY
IMAGE PROCESSING
MICROSCOPY
PROCESSING
RESOLUTION
SCATTERING AMPLITUDES
SIMULATION
TRANSMISSION ELECTRON MICROSCOPY