Nanoscale deformation analysis with high-resolution transmission electron microscopy and digital image correlation

Wang, Xueju; Pan, Zhipeng; Fan, Feifei; Wang, Jiangwei; Liu, Yang; Mao, Scott X.; Zhu, Ting; Xia, Shuman

doi:10.1115/1.4031332

Nanoscale deformation analysis with high-resolution transmission electron microscopy and digital image correlation

Journal Article · Thu Sep 10 00:00:00 EDT 2015 · Journal of Applied Mechanics

DOI:https://doi.org/10.1115/1.4031332· OSTI ID:1237660

Wang, Xueju ^[1]; Pan, Zhipeng ^[1]; Fan, Feifei ^[1]; Wang, Jiangwei ^[2]; Liu, Yang ^[3]; Mao, Scott X. ^[2]; Zhu, Ting ^[1]; Xia, Shuman ^[1]

Georgia Inst. of Technology, Atlanta, GA (United States)
Univ. of Pittsburgh, Pittsburgh, PA (United States)
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

We present an application of the digital image correlation (DIC) method to high-resolution transmission electron microscopy (HRTEM) images for nanoscale deformation analysis. The combination of DIC and HRTEM offers both the ultrahigh spatial resolution and high displacement detection sensitivity that are not possible with other microscope-based DIC techniques. We demonstrate the accuracy and utility of the HRTEM-DIC technique through displacement and strain analysis on amorphous silicon. Two types of error sources resulting from the transmission electron microscopy (TEM) image noise and electromagnetic-lens distortions are quantitatively investigated via rigid-body translation experiments. The local and global DIC approaches are applied for the analysis of diffusion- and reaction-induced deformation fields in electrochemically lithiated amorphous silicon. As a result, the DIC technique coupled with HRTEM provides a new avenue for the deformation analysis of materials at the nanometer length scales.

View Accepted Manuscript (DOE)

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000

OSTI ID:: 1237660

Report Number(s):: SAND--2015-4991J; 594412

Journal Information:: Journal of Applied Mechanics, Journal Name: Journal of Applied Mechanics Journal Issue: 12 Vol. 82; ISSN 0021-8936

Publisher:: ASMECopyright Statement

Country of Publication:: United States

Language:: English

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77 NANOSCIENCE AND NANOTECHNOLOGY
deformation
displacement
errors
lenses (optics)
nanoscale phenomena
noise (sound)
resolution (optics)
transmission electron microscopy

Nanoscale deformation analysis with high-resolution transmission electron microscopy and digital image correlation

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