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In situ synchrotron studies of the structural properties of Y-Ba-Cu-O thin films during growth

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.104906· OSTI ID:5623825
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  1. NSF Science and Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208 (USA) Materials Research Center, Northwestern University, Evanston, Illinois 60208 (USA)
We report the first real time, {ital in} {ital situ} synchrotron x-ray studies of Y-Ba-Cu-O thin-film growth on (100) SrTiO{sub 3} using a miniature, faced-magnetron sputtering system. A combination of the substrate temperature and the deposition rate determines whether the film grows along the {ital a}, {ital c}, or multiple axes.
OSTI ID:
5623825
Journal Information:
Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 58:20; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English