Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Effects of deposition rate and substrate temperature on the orientation and the growth of YBa sub 2 Cu sub 3 O sub x thin films

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5932750
; ; ; ; ; ; ; ;  [1]
  1. Northwestern Univ., Evanston, IL (United States). Materials Research Center
This paper reports what the authors believe to be the first real time, in situ studies of film growth by sputtering using synchrotron X-rays; the structure and growth habit of YBa{sub 2}Cu{sub 3}O{sub 7} (YBCO) thin films deposited on (100) SrTiO{sub 3} in a miniature, faced- magnetron sputtering system have been investigated. A combination of the substrate temperature and the deposition rate determines whether the film grows along the a, c, or multiple axes. At low substrate temperatures and low deposition rates, the films grow preferentially along the a- axis. In contrast, higher substrate temperatures and high deposition rates favor c-axis oriented film growth with some admixture of (220). The X-ray diffraction peaks were monitored in real time revealing that both a-axis and c-axis oriented grains nucleated on the surface of the (100) SrTiO{sub 3} between 625{degrees} and 765{degrees}C, although the volume fraction of each orientation was temperature dependent.
OSTI ID:
5932750
Report Number(s):
CONF-900944--
Conference Information:
Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 27:2
Country of Publication:
United States
Language:
English