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Growth and characterization of Y-Ba-Cu-O high- Tc superconductor thin films

Thesis/Dissertation ·
OSTI ID:7202999
Two types of growth processes of Y-Ba-Cu-O thin films were investigated: three-step processes involving post-deposition high-temperature anneals, and in-situ growth processes. Films were deposited by sequential ion beam sputtering from elemental Y, Ba and Cu targets, and characterized by various methods. In the three-step process, multilayers of {approximately}60 {angstrom} periodicity were deposited on (001) SrTiO{sub 3}, annealed in oxygen at 850-900C, and subsequently at 400-500C, to obtain the superconducting YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} phase. The films were epitaxial, predominantly single phase, with different orientations. The in-situ growth of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} films by sequential ion beam sputtering was investigated. The films were deposited following the stacking sequence, with the individual layer thicknesses nominally equal to one monolayer, at temperatures between 550 and 750C. O{sub 2} was supplied during growth. Epitaxial, c-axis oriented films were obtained on MgO and SrTiO{sub 3}. The correlations between deposition parameters, and structural and electrical properties were investigated. The films had expanded c-axis lattice parameters. The superconducting transition temperatures decreased with the enlargement of the c-lattice parameter.
Research Organization:
California Inst. of Tech., Pasadena, CA (United States)
OSTI ID:
7202999
Country of Publication:
United States
Language:
English

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