Critical currents in sputtered Nb-Ta multilayers

Journal Article · Fri Jan 01 04:00:00 EST 1988 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.37.68· OSTI ID:5620784

Broussard, P R; Geballe, T H

Critical-current measurements have been made on sputtered Nb-Ta multilayers for both perpendicular and parallel applied field. For large bilayer periods, the pinning force behaves as h(1-h) and is due to dislocation pinning. As the bilayer period decreases, the pinning force decreases and changes over to a collective mechanism. For parallel applied field, there is a lack of temperature scaling and an increase in the pinning force, which is due to pinning by the multilayering. A search for the existence of other effects is discussed.

• Research Organization: Naval Research Laboratory, Washington, D.C. 20375-5000
• OSTI ID: 5620784
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 37:1; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COATINGS
CRITICAL CURRENT
CRITICAL FIELD
CURRENTS
DISLOCATION PINNING
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRICAL PROPERTIES
ELEMENTS
MAGNETIC FIELDS
MAGNETIC FLUX
METALS
NIOBIUM
PHYSICAL PROPERTIES
SPUTTERING
SUPERCONDUCTIVITY
TANTALUM
TRANSITION ELEMENTS
VAPOR DEPOSITED COATINGS