Critical fields of Nb-Ta multilayers

Journal Article · Sun Feb 01 04:00:00 EST 1987 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.35.1664· OSTI ID:6974928

Broussard, P R; Geballe, T H

Nb-Ta multilayered films prepared by magnetron sputtering have been studied by critical-field measurements. We have examined the effects of substrate orientation and deposition temperature on the properties of the films. Three-dimensional to two-dimensional crossover is observed. For films with larger Nb layer thicknesses an additional transition in H/sub c//sub 2//sub X/ at lower temperatures is observed which cannot be accounted for by the interfacial regions.

• Research Organization: Department of Applied Physics, Stanford University, Stanford, California 94305
• OSTI ID: 6974928
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 35:4; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
CHALCOGENIDES
COHERENCE LENGTH
COHERENT SCATTERING
CORUNDUM
CRITICAL FIELD
DATA
DIFFRACTION
DIMENSIONS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EPITAXY
EQUIPMENT
EXPERIMENTAL DATA
GINZBURG-LANDAU THEORY
INFORMATION
LAYERS
LENGTH
MAGNETIC FIELDS
MAGNETRONS
METALS
MICROWAVE EQUIPMENT
MICROWAVE TUBES
MINERALS
NIOBIUM
NUMERICAL DATA
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SAPPHIRE
SCATTERING
SPUTTERING
SUBSTRATES
SUPERLATTICES
TANTALUM
TRANSITION ELEMENTS
X-RAY DIFFRACTION