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Sputtered Nb/Ta multilayers: a quantitative study of superconducting properties

Thesis/Dissertation ·
OSTI ID:5351668
Synthesis, structure, and superconducting properties of Nb/Ta multilayers are discussed. The multilayers were prepared by magnetron sputtering. X-ray diffraction was used to study the layering and structure of the samples. Longitudinal electrical-resistivity measurements were used to obtain the elastic mean free paths in the individual layers. Using the information on structure and mean free path, results of critical temperature, upper critical field, and critical current measurements were analyzed. The multilayers are found to grow epitaxially on sapphire substrates, but with substantially less dependence on substrate orientation or deposition temperature than has been previously seen. The system forms a coherent superlattice, with very little strain between the niobium and tantalum layers, as expected. The x-ray-diffraction profiles are identical to those of a mosaic crystal, indicating that the multilayers are well ordered. Electrical-resistivity measurements indicate that the samples are in the nearly clean to moderately dirty limit, in a superconducting sense. The results of superconducting critical-temperature measurements are analyzed in terms of the current proximity-effect theories. The measurements of upper critical field, both perpendicular and parallel to the direction of layering, are examined in light of the current models. Only qualitative agreement is found in each analysis due to the assumptions in the models.
Research Organization:
Stanford Univ., CA (USA)
OSTI ID:
5351668
Country of Publication:
United States
Language:
English