Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Effect of substrate temperature on the growth of Nb$$_3$$Sn film on Nb by multilayer sputtering

Journal Article · · TBD
OSTI ID:1832825
Nb3Sn films were fabricated by multilayer sequential sputtering on Nb substrates at substrate temperatures ranging from room temperature to 250 °C. The film material properties were characterized by X-ray diffraction, scanning electron microscopy, energy-dispersive X-ray spectroscopy, atomic force microscopy, and transmission electron microscopy. The films’ superconducting properties were studied by four-point probe resistivity measurements from room temperature to below the superconducting critical temperature Tc. The highest Tc was17.76 K, when the multilayers were deposited at room temperature. A superconducting Nb3Sn thin film with a smoother surface morphology but a lower Tc of 17.58 K was obtained on the film deposited at a substrate temperature of 250 °C.
Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States); Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1832825
Report Number(s):
FERMILAB-PUB-21-444-TD; arXiv:2109.07066; oai:inspirehep.net:1975199
Journal Information:
TBD, Journal Name: TBD
Country of Publication:
United States
Language:
English

Similar Records

Effect of substrate temperature on the growth of Nb3Sn film on Nb by multilayer sputtering
Journal Article · Tue Nov 01 20:00:00 EDT 2022 · Thin Solid Films · OSTI ID:1897614

Effect of layer thickness on structural, morphological and superconducting properties of Nb 3 Sn films fabricated by multilayer sequential sputtering
Conference · Sat Feb 29 23:00:00 EST 2020 · IOP Conference Series: Materials Science and Engineering · OSTI ID:1635661

Related Subjects