Effect of substrate temperature on the growth of Nb$$_3$$Sn film on Nb by multilayer sputtering
Journal Article
·
· TBD
OSTI ID:1832825
- Old Dominion U.
- Jefferson Lab
- Fermilab
Nb3Sn films were fabricated by multilayer sequential sputtering on Nb substrates at substrate temperatures ranging from room temperature to 250 °C. The film material properties were characterized by X-ray diffraction, scanning electron microscopy, energy-dispersive X-ray spectroscopy, atomic force microscopy, and transmission electron microscopy. The films’ superconducting properties were studied by four-point probe resistivity measurements from room temperature to below the superconducting critical temperature Tc. The highest Tc was17.76 K, when the multilayers were deposited at room temperature. A superconducting Nb3Sn thin film with a smoother surface morphology but a lower Tc of 17.58 K was obtained on the film deposited at a substrate temperature of 250 °C.
- Research Organization:
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States); Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
- DOE Contract Number:
- AC02-07CH11359
- OSTI ID:
- 1832825
- Report Number(s):
- FERMILAB-PUB-21-444-TD; arXiv:2109.07066; oai:inspirehep.net:1975199
- Journal Information:
- TBD, Journal Name: TBD
- Country of Publication:
- United States
- Language:
- English
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