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Evidence for bifurcation and universal chaotic behavior in nonlinear semiconducting devices

Technical Report ·
DOI:https://doi.org/10.2172/5592381· OSTI ID:5592381

Bifurcations, chaos, and extensive periodic windows in the chaotic regime are observed for a driven LRC circuit, the capacitive element being a nonlinear varactor diode. Measurements include power spectral analysis; real time amplitude data; phase portraits; and a bifurcation diagram, obtained by sampling methods. The effects of added external noise are studied. These data yield experimental determinations of several of the universal numbers predicted to characterize nonlinear systems having this route to chaos.

Research Organization:
Lawrence Berkeley Lab., CA (USA)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
5592381
Report Number(s):
LBL-13719; ON: DE82011106
Country of Publication:
United States
Language:
English

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