Qualifying commercial ICs for total-dose space environments
Conference
·
OSTI ID:5567378
- Sandia National Labs., Albuquerque, NM (United States)
- Alliance Technologies Inc., Albuquerque, NM (United States)
Total-dose failure levels are measured for commercial FPGAs using MIL-STD 883D method 1019.4 and a modified test protocol with a room-temperature biased anneal following irradiation. These are compared with device response to low dose-rate irradiations. 10 refs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- DOE; DNA; USDOE, Washington, DC (United States); Defense Nuclear Agency, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5567378
- Report Number(s):
- SAND-92-0382C; CONF-920716--3; ON: DE92009069
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANNEALING
DOSE RATES
ELECTRICAL TESTING
ELECTRONIC CIRCUITS
FAILURE MODE ANALYSIS
HARDENING
HEAT TREATMENTS
INTEGRATED CIRCUITS
MATERIALS TESTING
MICROELECTRONIC CIRCUITS
MOS TRANSISTORS
NONDESTRUCTIVE TESTING
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TESTING
TRANSISTORS
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANNEALING
DOSE RATES
ELECTRICAL TESTING
ELECTRONIC CIRCUITS
FAILURE MODE ANALYSIS
HARDENING
HEAT TREATMENTS
INTEGRATED CIRCUITS
MATERIALS TESTING
MICROELECTRONIC CIRCUITS
MOS TRANSISTORS
NONDESTRUCTIVE TESTING
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TESTING
TRANSISTORS