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Electron-yield EXAFS studies of Tb/FeCo and Tb/Fe multilayers

Conference ·
OSTI ID:5565581
 [1];  [2];  [3];  [3];  [4];  [4];  [5]
  1. Catholic Univ. Medical College, Seoul (Republic of Korea). Dept. of Physics
  2. Korea Institute of Science and Technology (KIST), Seoul (Korea, Republic of)
  3. SKC Ltd., Chonan (Republic of Korea). Central Research Center
  4. Pohang Inst. of Science and Technology (Republic of Korea). Dept. of Chemistry
  5. Brookhaven National Laboratory (BNL), Upton, NY (United States)
By using the electron-yield detection technique, the EXAFS spectra for Tb/FeCo and Tb/Fe multilayers, as well as a TbFeCo alloy and some reference thin films, have been measured. These multilayers were prepared by sputtering onto float-glass substrates, and had the total thickness of 1000Å with various individual layer thickness or period values. An electron detector obtained from the EXAFS company of F.W. Lytle was used for the measurements and the high quality of data shows that the electron-yield detection technique is especially suitable for studies of multilayers. Preliminary analysis results show some qualitative tendencies which need to be checked with more careful analyses and, if possible, with some low temperature data.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-76CH00016
OSTI ID:
5565581
Report Number(s):
BNL--46298; CONF-9104273--2; ON: DE91014786
Country of Publication:
United States
Language:
English

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