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Fine-grained base electrode process for Pb-alloy Josephson technology

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.572226· OSTI ID:5553836
A method of producing fine-grained PbInAu thin films reported by Huang and co-workers has been evaluated for use in Josephson technology integrated circuits. Both junction-related and nonjunction characteristics of the base electrode layer were considered. It was found necessary to interchange the order of deposition of two of the layers in the vertical structure and to modify the homogenization step in the base electrode process. The fine grain size of the films was found to be due to the presence of a layer of AuIn/sub 2/ precipitates which impede grain growth.
Research Organization:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
OSTI ID:
5553836
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 1:4; ISSN JVTAD
Country of Publication:
United States
Language:
English