Investigation of deep level defects in epitaxial semiconducting zinc sulpho-selenide. Progress report, 15 June 1979-14 June 1980
In an effort to understand the defect structure of the ternary II-VI compound zinc sulpho-selenide, the binary compound zinc selenide was investigated. Thin single crystalline films of zinc selenide were heteroepitaxially grown on (100) GaAs. Epitaxial layers from 5 to 50 microns thick could be readily grown using a chemical vapor transport technique. The layers had an excellent morphology with few stacking faults and hillocks. Detailed epitaxial growth kinetics were examined as a function of temperature and reactant concentration. It was found that hydrogen flow rate, source and substrate temperature affect the growth rate of the epitaxial films. Au - ZnSe Schottky barrier diodes and ZnSe - GaAs n-p heterojunctions were prepared from the epitaxial layers. Current-voltage characteristics were measured on both types of diodes. From capacitance-voltage measurements the residual doping density of the epitaxial layers were found to be of the order of 10/sup 14/ - 10/sup 15/ cm/sup -3/. Finally, we have begun to measure the deep level spectrum of both the Schottky barrier diodes and the heterojunctions. Deep level transient spectroscopy appears to be well suited for determining trapping states in ZnSe provided the material has a low enough resistivity.
- Research Organization:
- Northwestern Univ., Evanston, IL (USA)
- DOE Contract Number:
- AC02-79ER10390
- OSTI ID:
- 5542580
- Report Number(s):
- DOE/ER/10390-1
- Country of Publication:
- United States
- Language:
- English
Similar Records
Investigation of deep level defects in epitaxial semiconducting zinc sulpho-selenide. Progress report, June 15, 1980-June 14, 1981
Deep level defects in heteroepitaxial zinc selenide
Investigation of deep level defects in epitaxial semiconducting. Progress report, June 15, 1982-June 14, 1983. [N-n ZnSe/GaAs]
Technical Report
·
Sat Feb 14 23:00:00 EST 1981
·
OSTI ID:6653403
Deep level defects in heteroepitaxial zinc selenide
Journal Article
·
Wed Mar 31 23:00:00 EST 1982
· J. Appl. Phys.; (United States)
·
OSTI ID:5456805
Investigation of deep level defects in epitaxial semiconducting. Progress report, June 15, 1982-June 14, 1983. [N-n ZnSe/GaAs]
Technical Report
·
Mon Feb 14 23:00:00 EST 1983
·
OSTI ID:6385646
Related Subjects
36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
360603 -- Materials-- Properties
ARSENIC COMPOUNDS
ARSENIDES
CHALCOGENIDES
CRYSTAL DEFECTS
CRYSTAL GROWTH
CRYSTAL STRUCTURE
CURRENT DENSITY
DESIGN
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
EPITAXY
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
PERFORMANCE
PHYSICAL PROPERTIES
PNICTIDES
SCHOTTKY BARRIER DIODES
SELENIDES
SELENIUM COMPOUNDS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SUBSTRATES
TEMPERATURE DEPENDENCE
TRAPPING
ZINC COMPOUNDS
ZINC SELENIDES
360601* -- Other Materials-- Preparation & Manufacture
360603 -- Materials-- Properties
ARSENIC COMPOUNDS
ARSENIDES
CHALCOGENIDES
CRYSTAL DEFECTS
CRYSTAL GROWTH
CRYSTAL STRUCTURE
CURRENT DENSITY
DESIGN
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
EPITAXY
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
PERFORMANCE
PHYSICAL PROPERTIES
PNICTIDES
SCHOTTKY BARRIER DIODES
SELENIDES
SELENIUM COMPOUNDS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SUBSTRATES
TEMPERATURE DEPENDENCE
TRAPPING
ZINC COMPOUNDS
ZINC SELENIDES