Application of the nuclear microprobe to the imaging of single event upsets in integrated circuits
Conference
·
OSTI ID:5529366
A new form of microscopy has been developed which produces micron- resolution maps of where single event upsets occur during ion irradiation of integrated circuits. utilizing a nuclear microprobe, this imaging technique can irradiate, in isolation, the lowest functional units of an integrated circuit (e.g. transistor drains, gates, feedback resistors) and measure immediately the effect of a high energy ion strike on circuit performance. Such detailed circuit characterization can provide heretofore inaccessible information to the designers of integrated circuits that are to be used in space or other radiation environments. 5 refs., 6 figs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5529366
- Report Number(s):
- SAND-91-0799C; CONF-9105197--2; ON: DE91014701
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440100 -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHEMICAL ANALYSIS
DATA ACQUISITION SYSTEMS
ELECTRONIC CIRCUITS
ELEMENTS
ENERGY TRANSFER
INTEGRATED CIRCUITS
ION MICROPROBE ANALYSIS
ION MICROSCOPY
MAPPING
MICROANALYSIS
MICROELECTRONIC CIRCUITS
MICROSCOPY
NONDESTRUCTIVE ANALYSIS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RESOLUTION
SEMIMETALS
SILICON
SPATIAL RESOLUTION
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440100 -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHEMICAL ANALYSIS
DATA ACQUISITION SYSTEMS
ELECTRONIC CIRCUITS
ELEMENTS
ENERGY TRANSFER
INTEGRATED CIRCUITS
ION MICROPROBE ANALYSIS
ION MICROSCOPY
MAPPING
MICROANALYSIS
MICROELECTRONIC CIRCUITS
MICROSCOPY
NONDESTRUCTIVE ANALYSIS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RESOLUTION
SEMIMETALS
SILICON
SPATIAL RESOLUTION