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Single crystal, epitaxial multilayers of AlAs, GaAs, and Al/sub x-italic/Ga/sub 1-//sub x-italic/As for use as optical interferometric elements

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.97126· OSTI ID:5503096

We propose using single crystal multilayers of AlAs, GaAs, and Al/sub x-italic/Ga/sub 1-//sub x-italic/As for use as several different kinds of optical interference elements which include high reflectors, transmission filters, and Fabry--Perot cavities. We have grown many of these structures by molecular beam epitaxy and measured their optical characteristics. We find the characteristics of these structures to be very useful for a number of applications for integrated optical devices which we also propose.

Research Organization:
Sandia National Laboratories, Albuquerque, New Mexico 87185
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5503096
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 49:9; ISSN APPLA
Country of Publication:
United States
Language:
English