Single crystal, epitaxial multilayers of AlAs, GaAs, and Al/sub x-italic/Ga/sub 1-//sub x-italic/As for use as optical interferometric elements
Journal Article
·
· Appl. Phys. Lett.; (United States)
We propose using single crystal multilayers of AlAs, GaAs, and Al/sub x-italic/Ga/sub 1-//sub x-italic/As for use as several different kinds of optical interference elements which include high reflectors, transmission filters, and Fabry--Perot cavities. We have grown many of these structures by molecular beam epitaxy and measured their optical characteristics. We find the characteristics of these structures to be very useful for a number of applications for integrated optical devices which we also propose.
- Research Organization:
- Sandia National Laboratories, Albuquerque, New Mexico 87185
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5503096
- Journal Information:
- Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 49:9; ISSN APPLA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
CRYSTALS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
INTERFERENCE
INTERFEROMETRY
LIGHT TRANSMISSION
MATERIALS
MONOCRYSTALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PNICTIDES
REFRACTIVITY
SUPERLATTICES
360603* -- Materials-- Properties
ALUMINIUM ARSENIDES
ALUMINIUM COMPOUNDS
ARSENIC COMPOUNDS
ARSENIDES
CRYSTALS
GALLIUM ARSENIDES
GALLIUM COMPOUNDS
INTERFERENCE
INTERFEROMETRY
LIGHT TRANSMISSION
MATERIALS
MONOCRYSTALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PNICTIDES
REFRACTIVITY
SUPERLATTICES