Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Elliptical x-ray analyzer spectrograph application to a laser-produced plasma

Conference ·
OSTI ID:5486644
This spectrograph was designed to record a range of 100 to 2000 eV x-rays on calibrated Kodak Rar-2497 film. Using point calibrations and theoretical models, the spectrograph efficiency was predicted. Basic spectrograph geometry and photographic calibrations are presented in companion papers. A 20 J, 6 ns duration Nd:glass laser pulse was focussed upon planar targets of gold, aluminum, teflon and boron carbide. Sample spectra for line and x-ray yields analysis are presented.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA); Hawaii Univ., Honolulu (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5486644
Report Number(s):
SAND-85-0302C; CONF-850887-2; ON: DE85013790
Country of Publication:
United States
Language:
English