Triple modular redundancy for yield and reliability enhancement in integrated circuits

Thesis/Dissertation · Tue Jan 01 04:00:00 EST 1985

OSTI ID:5480154

York, G A

Redundancy is commonly used to enhance yield of integrated circuits. This research examines one type of redundancy (Triple Modular Redundancy-TMR) that can be used to improve both yield and reliability of ICs. In the past, TMR has been used to improve the reliability of electronic systems. When used for yield enhancement, many new issues arise related to modeling of the TMR ICs. This research improves existing models in two areas: compensating (or orthogonal) faults, and shared logic. Previous models are shown to be inadequate, and new models are developed that allow a time accuracy tradeoff. In addition, two design tools were written that can help the IC designer predict yield and reliability. The tools have a powerful predictive capability based on a statistical model of logic sharing that has been developed. The design tools were used to explore portions of the TMR IC design space such that guidelines were determined for designers using TMR for ICs.

• Research Organization: Carnegie-Mellon Univ., Pittsburgh, PA (USA)
• OSTI ID: 5480154
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
99 GENERAL AND MISCELLANEOUS
990200* -- Mathematics & Computers
DESIGN
ELECTRONIC CIRCUITS
INTEGRATED CIRCUITS
LOGIC CIRCUITS
MATHEMATICAL MODELS
MICROELECTRONIC CIRCUITS
RELIABILITY
YIELDS