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Solutions to single event current induced avalanche burnout

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
DOI:https://doi.org/10.1063/1.40095· OSTI ID:5471787
;  [1]
  1. Sandia National Laboratories, P.O. Box 5800 Albuquerque, NM 87185 (US)

Reviews of normal breakdown and current induced avalanche breakdown mechanisms in silicon power transitors are presented. We show the applicability of the current induced avalanche model to heavy ion induced burnouts. Finally, we present solutions to current induced avalanche in silicon power semiconductors.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
5471787
Report Number(s):
CONF-910116--
Journal Information:
AIP Conference Proceedings (American Institute of Physics); (United States), Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Vol. 217:2; ISSN 0094-243X; ISSN APCPC
Country of Publication:
United States
Language:
English