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Corrosion-induced surface states on n-GaAs as studied by photoluminescence versus voltage scans and luminescence decays

Journal Article · · Journal of Physical Chemistry; (United States)
DOI:https://doi.org/10.1021/j100137a027· OSTI ID:5462459
;  [1]
  1. Univ. of Oregon, Eugene, OR (United States)
Picosecond photoluminescence studies of n-GaAs electrodes have been performed to characterize surface states present at the GaAs/electrolyte interface. Potential-dependent photoluminescence and luminescence decay measurements under high photon flux indicate that as the applied voltage is biased more positive than E[sub CB] - 1 V, new surface states are formed. These appear to be corrosion states since increasing the sulfide (S[sup 2[minus]]) concentration reduces the observed effects. Photocurrent measurements reveal that these corrosion-induced traps are sites of radiationless electron-hole recombination and do not mediate charge transfer. Laser repetition rate experiments indicate that the time to empty and refill the surface states on the uncorroded surface is on the order of microseconds, so these intrinsic traps likely mediate charge transfer. 21 refs., 9 figs.
DOE Contract Number:
FG06-86ER45273
OSTI ID:
5462459
Journal Information:
Journal of Physical Chemistry; (United States), Journal Name: Journal of Physical Chemistry; (United States) Vol. 97:35; ISSN JPCHAX; ISSN 0022-3654
Country of Publication:
United States
Language:
English