Surface topography of thin Au and Pd films after ion bombardment studied with STM
Conference
·
OSTI ID:541134
- Univ. Goettingen (Germany)
The changes in surface topography of thin metallic films during ion bombardment were investigated with STM. Pd and Au thin films, having defect-free, atomically flat areas over at least 300 x 300 {angstrom}{sup 2} were bombarded with Ar{sup +}, Kr{sup +}, Xe{sup +} ions. Ion energies and target temperatures were varied. The roughening after high fluence irradiation shows scaling with a roughness exponent 0.84. For 300 K target temperature the authors observe, both for Au and Pd, 3 D erosion, for 700 K, on the contrary, layer-by-layer erosion. The differences in erosion morphologies between Au and Pd surfaces are supposed to stem from differences in surface mobility of adatoms.
- OSTI ID:
- 541134
- Report Number(s):
- CONF-961202--; ISBN 1-55899-343-6
- Country of Publication:
- United States
- Language:
- English
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