High resolution transmission electron microscopy of defect clusters in aluminum during electron and ion irradiation at room temperature
- National Research Inst. for Metals, Sakura, Tsukuba (Japan)
Defect clusters in Al during electron and ion irradiation have been investigated using high-resolution transmission electron microscopy (HRTEM). An ION/HVEM system which consists of a high-voltage TEM and ion implanters was used for in-situ observation of damage evolution under 1,000 keV electrons and 15 keV He{sup +} irradiation at room temperature. HRTEM of Al in [110] orientation showed many planar defects along {l_brace}111{r_brace} planes during electron irradiation, while a high density of small polyhedron-shaped cavities (He-bubbles) was observed in addition to the planar defects after He{sup +} irradiation. Multi-slice image simulation of various models of dislocation loops indicated the planar defect as an interstitial-type Frank loop.
- OSTI ID:
- 541132
- Report Number(s):
- CONF-961202--; ISBN 1-55899-343-6
- Country of Publication:
- United States
- Language:
- English
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