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Photoconductivity and light-induced change in a-italic-Si:H

Journal Article · · Phys. Rev. B: Condens. Matter; (United States)
Capture-rate constants for the trapping of free carriers into different gap-state species are determined by calculating dc photoconductivity at intermediate generation rates versus the inverse temperature and fitting to data measured on undoped a-italic-Si:H in the as-grown and light-soaked states. In the as-grown state, recombination is dominated by high-capture-rate centers near the Fermi level (dangling bonds) at and above 300 K. To explain the second peak and rapid decrease in photoconductivity at lower temperatures, an energy-dependent capture rate must be invoked on the smaller-cross-section band-tail states, indicating a multiphonon energy-loss process for the trapping of free charge. After 90 h of exposure to 100 mW/cm/sup 2/ of light, the decrease found in photoconductivity is explained only by increases in both dangling-bond recombination at and above room temperature a-italicn-italicd-italic tail-state recombination at lower temperatures. The increased recombination at lower temperatures after light soaking is attributed to additional donor states located 0.23 eV above the valence-band edge.
Research Organization:
Solar Energy Research Institute, Golden, Colorado 80401
DOE Contract Number:
AC02-83CH10093
OSTI ID:
5392725
Journal Information:
Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 34:4; ISSN PRBMD
Country of Publication:
United States
Language:
English