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Study of irradiation-induced defects in germanium

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.339939· OSTI ID:5372892
Radiation-induced defects in germanium were studied using deep-level transient spectroscopy and stress transient spectroscopy. Four electron traps have been identified: the planar four vacancy at E/sub c/ -0.09 eV, the divacancy at E/sub c/ -0.17 eV, the vacancy-oxygen pair at E/sub c/ -0.27 eV, and the donor-vacancy pair level at E/sub c/ -0.35 eV.
Research Organization:
University of Missouri, Research Reactor, Columbia, Missouri 65211
OSTI ID:
5372892
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 63:5; ISSN JAPIA
Country of Publication:
United States
Language:
English