Chemical modifications at Teflon interfaces induced by MeV ion beams

Journal Article · Sun Oct 15 04:00:00 EDT 1989 · Journal of Applied Physics; (USA)

DOI:https://doi.org/10.1063/1.344083· OSTI ID:5372798

Ingemarsson, P A ^[1]; Keane, M P; Gelius, U ^[2]

---

1. Department of Radiation Sciences, Uppsala University, Box 535, S-751 21 Uppsala, Sweden (SE)
2. Department of Physics, Uppsala University, Box 530, S-751 21 Uppsala, Sweden

The effect of MeV ion beams incident on Teflon surfaces was studied by x-ray photoelectron spectroscopy (XPS). Irradiation with 20-MeV {sup 35}Cl{sup 4+} was carried out at doses ranging from 10{sup 12} to 10{sup 14} ions/cm{sup 2}. Residual gas analysis was performed during irradiation to identify molecular fragments released from the Teflon surface. XPS spectra were recorded before and after ion irradiation. On some substrates, gold thin films were evaporated before and after ion bombardment, respectively, to detect possible modifications in thin-film adhesion. Changes in the XPS spectra were interpreted in terms of chemical and structural shifts, and related to the observed adhesion modifications.

• OSTI ID: 5372798
• Journal Information: Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 66:8; ISSN 0021-8979; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
400600* -- Radiation Chemistry
ADHESION
CHARGED PARTICLES
CHEMICAL RADIATION EFFECTS
CHEMISTRY
CHLORINE IONS
COLLISIONS
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY RANGE
FILMS
FLUORINATED ALIPHATIC HYDROCARBONS
GOLD
HALOGENATED ALIPHATIC HYDROCARBONS
ION COLLISIONS
IONIZING RADIATIONS
IONS
MATERIALS
METALS
MEV RANGE
MEV RANGE 10-100
ORGANIC COMPOUNDS
ORGANIC FLUORINE COMPOUNDS
ORGANIC HALOGEN COMPOUNDS
PETROCHEMICALS
PETROLEUM PRODUCTS
PHOTOELECTRON SPECTROSCOPY
PLASTICS
POLY
POLYETHYLENES
POLYTETRAFLUOROETHYLENE
RADIATION CHEMISTRY
RADIATION EFFECTS
RADIATIONS
SPECTROSCOPY
SURFACES
SYNTHETIC MATERIALS
TEFLON
THIN FILMS
TRANSITION ELEMENTS
X RADIATION