Adhesion of evaporated titanium films to ion-bombarded polyethylene

Journal Article · Fri Aug 01 04:00:00 EDT 1986 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.337361· OSTI ID:5587447

Bodoe, P; Sundgren, J

Ti films were deposited onto high-density polyethylene (HDPE) samples by electron-beam evaporation. Prior to film deposition the samples were i-italicn-italic s-italici-italict-italicu-italic pretreated by Ar ion bombardment using a sputter ion gun. The adhesion of the films, determined as the pull strength required for film failure, was measured as a function of ion dose. HDPE substrates processed at two different temperatures were examined. The adhesion of the Ti films to HDPE samples processed at roughly-equal150 /sup 0/C increased with the ion dose to a steady-state value corresponding to the cohesive strength of the HDPE substrate. The adhesion to the samples processed at roughly-equal200 /sup 0/C increased to a maximum and then decreased for further ion bombardment to a level of the same order as that for films deposited onto as-prepared samples. The effects of the ion bombardment upon the HDPE surface chemistry were examined by means of x-ray photoelectron spectroscopy (XPS). The ion bombardment resulted in dehydrogenation and cross linking of the surface region and for prolonged ion bombardment, a graphitelike surface was obtained. The film/substrate interface as well as the initial Ti film growth were examined by XPS analysis. A chemical interaction which resulted in Ti--C bonds was observed at the interface. The Ti film growth followed a pronounced three-dimensional growth mode on as-prepared surfaces whereas the ion bombardment resulted in a change toward a more two-dimensional growth mode. The difference in adhesion behavior for the two types of HDPE substrates was found to be due to a difference in the amounts of low molecular weight products present within the substrates.

• Research Organization: Thin Film Group, Department of Physics and Measurement Technology, Linkoeping University, S-581 83 Linkoeping, Sweden
• OSTI ID: 5587447
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 60:3; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360106* -- Metals & Alloys-- Radiation Effects
ADHESION
ARGON IONS
CHARGED PARTICLES
CHEMICAL BONDS
COLLISIONS
DEPOSITION
ELECTROMAGNETIC RADIATION
ELECTRON SPECTROSCOPY
ELEMENTS
FILMS
ION COLLISIONS
IONIZING RADIATIONS
IONS
MEDIUM TEMPERATURE
METALS
ORGANIC COMPOUNDS
ORGANIC POLYMERS
PHOTOELECTRON SPECTROSCOPY
PHYSICAL RADIATION EFFECTS
POLYETHYLENES
POLYMERS
POLYOLEFINS
RADIATION EFFECTS
RADIATIONS
SPECTROSCOPY
SURFACE COATING
SURFACE TREATMENTS
THIN FILMS
TITANIUM
TRANSITION ELEMENTS
X RADIATION