Design of a microprogram control unit with concurrent error detection

Conference · Sat Jan 01 00:00:00 EST 1983

OSTI ID:5362472

Yu Wong, C; Fuchs, W K; Abrahams, J A; Davidson, E S

The authors present an integrated approach to the design and implementation of a microprogram control unit (MCU) with comprehensive concurrent error detection (CED) capability. The AM2910 microprogram sequencer is used as a functional model. It has been shown that the classical stuck-at fault model alone is not sufficient to describe failures in VLSI circuits. Various potential failures in the MCU are discussed and a functional level fault model is used, namely, arbitrary failures in single copies of functional units and unidirectional errors in stored words and on control or data transfer buses. Based on this fault model, Berger Coding (BERG61) and duplication techniques are used to provide the error-detecting capability of the MCU. 16 references.

• OSTI ID: 5362472
• Resource Relation: Conference: Sponsored by IEEE, Milan, Italy, 28 Jun 1983
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
COMPUTERS
FAILURES
ARRAY PROCESSORS
DATA TRANSMISSION
DESIGN
ERRORS
INTEGRATED CIRCUITS
PROGRAMMING
COMMUNICATIONS
ELECTRONIC CIRCUITS
MICROELECTRONIC CIRCUITS
990200* - Mathematics & Computers