Design approach for a microprogrammed control unit with built in self test
Conference
·
OSTI ID:5140680
An architecture allowing concurrent self-testing of a microprogrammed control unit is presented and compared with other control unit testing strategies. This approach allows testing of the control unit independent of the operational section, minimizes the hardcore, and is easily incorporated in microprogrammed control units. Since testing is concurrent, the probability of detecting intermittent errors is high. VLSI implementations are feasible. 14 references.
- OSTI ID:
- 5140680
- Country of Publication:
- United States
- Language:
- English
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