Overview on radiation effects in electronics
Conference
·
OSTI ID:5362092
- Sandia National Labs., Albuquerque, NM (USA)
The radiation spectrum constituents of interest to microelectronics are prompt gamma or x-ray, total dose, neutrons (or protons), and cosmic radiation. Each of these constituents has a unique effect upon microelectronic components and requires unique techniques to improve the microelectronic radiation tolerance to such an exposure. This paper reviews the radiation effects associated with the natural space and nuclear reactor radiation environment, that is to say, total dose, neutrons, and cosmic rays. 2 refs., 6 figs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- Sponsoring Organization:
- DOE/DP
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5362092
- Report Number(s):
- SAND-89-2277C; CONF-900109--6; ON: DE90000841
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COSMIC RADIATION
ELECTROMAGNETIC RADIATION
ELECTRONIC EQUIPMENT
EQUIPMENT
GAMMA RADIATION
IONIZING RADIATIONS
MICROELECTRONICS
NEUTRON FLUX
NUCLEAR FACILITIES
RADIATION EFFECTS
RADIATION FLUX
RADIATIONS
SPACE VEHICLE COMPONENTS
X RADIATION
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COSMIC RADIATION
ELECTROMAGNETIC RADIATION
ELECTRONIC EQUIPMENT
EQUIPMENT
GAMMA RADIATION
IONIZING RADIATIONS
MICROELECTRONICS
NEUTRON FLUX
NUCLEAR FACILITIES
RADIATION EFFECTS
RADIATION FLUX
RADIATIONS
SPACE VEHICLE COMPONENTS
X RADIATION