(Intermediate voltage electron microscope)

Technical Report · Mon Nov 27 04:00:00 EST 1989

DOI:https://doi.org/10.2172/5356814· OSTI ID:5356814

Kenik, E. A.

This workshop, Invitation to Hitachi Electron Microscopy Technology'' was sponsored by Hitachi, Ltd. and was extended to nine electron microscopists from the USA and Europe. The main purpose of the trip was to introduce the first commercially available intermediate voltage electron microscope equipped with a field emission electron source. The capabilities of the Hitachi HF-2000 were demonstrated to this select group of microscopists. The HF-2000 appears to be the culmination of a long period of development by Hitachi to provide an electron microscope with good high spatial resolution imaging and analytical capabilities. In addition, some of the pioneering work on electron holography performed by Dr. A. Tonomura's group was highlighted. Brief reviews and demonstrations of analytical instruments and research at both the Hitachi Central Research Laboratory (HCRL) and the Naka Works were also given. There were many discussions of high resolution imaging, analytical electron microscopy, electron holography, and singular or combined applications of such techniques, and the particular electron microscopy needs, both current and future, of the visiting electron microscopists.

• Research Organization: Oak Ridge National Lab., TN (USA)
• Sponsoring Organization: DOE/ER
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 5356814
• Report Number(s): ORNL/FTR-3480; ON: DE90003590
• Country of Publication: United States
• Language: English

Related Subjects

440100* -- Radiation Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ASIA
ELECTRON MICROSCOPES
EMISSION
FIELD EMISSION
FORECASTING
JAPAN
MEASURING METHODS
MEETINGS
MICROSCOPES
PERFORMANCE TESTING
TESTING
TRAVEL
USES