SHaRE: Collaborative materials science research
Conference
·
OSTI ID:5353069
The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, techniques, and recognized expertise in the Division. The microscopy facilities include four analytical electron microscopes (one 300 kV, one 200 kV, and two 120 kV instruments), a conventional transmission electron microscope with a low field polepiece for examination of ferromagnetic materials, a high voltage (1 MV) electron microscope with a number of in situ capabilities, and a variety of EM support facilities. An atom probe field ion microscope provides microstructural and elemental characterization at atomic resolution. Other facilities utilized under SHaRE include several Auger electron spectroscopy/surface analytical instruments, a triple beam Van de Graaff accelerator facility for nuclear microanalysis techniques, various x-ray diffraction instruments, a Nanoindenter for high spatial resolution mechanical property measurements, and a host of other advanced and unique facilities.
- Research Organization:
- Oak Ridge National Lab., TN (USA); Oak Ridge Associated Universities, Inc., TN (USA)
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 5353069
- Report Number(s):
- CONF-880841-2; ON: DE88007175
- Country of Publication:
- United States
- Language:
- English
Similar Records
Shared research equipment at Oak Ridge National Laboratory
Thin film characterization using analytical electron microscopy
High-voltage analytical electron microscopy
Conference
·
Sat Jan 31 23:00:00 EST 1998
·
OSTI ID:650362
Thin film characterization using analytical electron microscopy
Journal Article
·
Mon Dec 31 23:00:00 EST 1979
· Thin Solid Films; (United States)
·
OSTI ID:6870947
High-voltage analytical electron microscopy
Conference
·
Fri Dec 31 23:00:00 EST 1982
·
OSTI ID:5960944
Related Subjects
42 ENGINEERING
420500* -- Engineering-- Materials Testing
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
CERAMICS
COORDINATED RESEARCH PROGRAMS
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY-LOSS SPECTROSCOPY
MATERIALS
MATERIALS TESTING
METALS
MICROSCOPY
RESEARCH PROGRAMS
SPECTROSCOPY
TEST FACILITIES
TESTING
X-RAY SPECTROSCOPY
420500* -- Engineering-- Materials Testing
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
CERAMICS
COORDINATED RESEARCH PROGRAMS
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
ENERGY-LOSS SPECTROSCOPY
MATERIALS
MATERIALS TESTING
METALS
MICROSCOPY
RESEARCH PROGRAMS
SPECTROSCOPY
TEST FACILITIES
TESTING
X-RAY SPECTROSCOPY