Application of synchrotron radiation to x-ray fluorescence analysis of trace elements

Conference · Fri Aug 01 04:00:00 EDT 1986

OSTI ID:5347193

Gordon, B M; Jones, K W; Hanson, A L

The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented.

• Research Organization: Brookhaven National Lab., Upton, NY (USA). Applied Science Dept.
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5347193
• Report Number(s): BNL-38535; CONF-860880-23; ON: DE86015144
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
BREMSSTRAHLUNG
CHEMICAL ANALYSIS
ELECTROMAGNETIC RADIATION
ELEMENTS
NONDESTRUCTIVE ANALYSIS
RADIATIONS
RESEARCH PROGRAMS
SYNCHROTRON RADIATION
TRACE AMOUNTS
USES
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS