Application of synchrotron radiation to x-ray fluorescence analysis of trace elements
The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented.
- Research Organization:
- Brookhaven National Lab., Upton, NY (USA). Applied Science Dept.
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 5347193
- Report Number(s):
- BNL-38535; CONF-860880-23; ON: DE86015144
- Resource Relation:
- Conference: 30. SPIE technical symposium on optics and optoelectronic engineering, San Diego, CA, USA, 17 Aug 1986; Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
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ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ELEMENTS
X-RAY FLUORESCENCE ANALYSIS
SYNCHROTRON RADIATION
USES
TRACE AMOUNTS
RESEARCH PROGRAMS
BREMSSTRAHLUNG
CHEMICAL ANALYSIS
ELECTROMAGNETIC RADIATION
NONDESTRUCTIVE ANALYSIS
RADIATIONS
X-RAY EMISSION ANALYSIS
400104* - Spectral Procedures- (-1987)