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U.S. Department of Energy
Office of Scientific and Technical Information

Direct determination of quantum efficiency of semiconducting films

Patent ·
OSTI ID:5333100

Photovoltaic quantum efficiency of semiconductor samples is determined directly, without requiring that a built-in photovoltage be generated by the sample. Electrodes are attached to the sample so as to form at least one Schottky barrier therewith. When illuminated, the generated photocurrent carriers are collected by an external bias voltage impressed across the electrodes. The generated photocurrent is measured, and photovoltaic quantum efficiency is calculated therefrom.

DOE Contract Number:
AC02-77CH00178
Assignee:
EDB-84-034718
Patent Number(s):
None
Application Number:
ON: DE84005989
OSTI ID:
5333100
Country of Publication:
United States
Language:
English