Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure

Journal Article · Thu Aug 15 00:00:00 EDT 1991 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.44.3475· OSTI ID:5277339

Woicik, J C ^[1]; Kendelewicz, T; Miyano, K E ^[2]; Cowan, P L; Bouldin, C E ^[1]; Karlin, B A ^[3]; Pianetta, P; Spicer, W E ^[2]

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1. National Institute of Standards and Technology, Gaithersburg, Maryland (USA)
2. Stanford Electronics Laboratory, Stanford University, Stanford, California (USA)
3. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York (USA)

Based on the surface extended x-ray-absorption fine-structure (SEXAFS) {ital absolute} surface coordination numbers, Woicik {ital et} {ital al}. (Phys. Rev. B 43, 4331 (1991)) argued that Sb trimers adsorb on the Si(111) surface in a modified bridge'' configuration rotated by 60{degree} relative to the atop milk stool'' geometry proposed by Abukawa {ital et} {ital al}. (Surf. Sci. Lett. 201, 513 (1988)). Using the accurate near-neighbor bond lengths as determined from SEXAFS, these models predict perpendicular distances of 1.76 and 2.60 A between the top Si atoms and the Sb layer, respectively. New back-reflection x-ray standing wave data find the Sb atoms to reside 2.53{plus minus}0.1 A above the Si surface, in clear support of the milk stool geometry. Polarization-dependent SEXAFS {ital relative} coordination numbers support the milk stool model as well.

• OSTI ID: 5277339
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 44:7; ISSN 0163-1829; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ADSORPTION
ANTIMONY
BOND LENGTHS
BREMSSTRAHLUNG
COORDINATION NUMBER
CRYSTAL STRUCTURE
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
INTERFACES
LENGTH
METALS
MICROSTRUCTURE
RADIATIONS
SEMIMETALS
SILICON
SORPTION
SPECTROSCOPY
STANDING WAVES
SYNCHROTRON RADIATION
X-RAY SPECTROSCOPY