Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Cadmium sulfide/copper sulfide heterojunction cell research. Quarterly technical progress report, June 1-September 30, 1979

Technical Report ·
DOI:https://doi.org/10.2172/5276979· OSTI ID:5276979
Off-stoiciometry CdS coatings with resistivities of about 10..cap omega..-cm have been deposited by a cyclic reactive sputtering process where the H/sub 2/S injection is periodically switched on and off. Cells with CdS layer fabricated in this way have yielded efficiencies of about 0.6% with short circuit currents of about 3.5 mA/cm/sup 2/, open circuit voltages of about 0.43V, and fill factors of about 0.40. CdS resistivity control by In doping has been achieved both by diffusion from a pre-deposited In layer and by using an In-doped Cd sputtering target. Resistivities of about 30..cap omega..-cm are achieved in CdS coatings about 5 um thick deposited at 250/sup 0/C over 50 nm thick In layers. A Cd cathode doped with 1 atomic percent In has yielded CdS coatings with resistivities of about 0.1 ..cap omega..-cm at substrate temperatures in the 100 to 300/sup 0/C range. Cells fabricated from the 0.1 ..cap omega..-cm CdS with a 0.5 um undoped layer adjacent to the junction have yielded encouraging diode characteristics with a strong photovoltaic effect and will be used to an optimization study. Cu/sub x/S coatings deposited onto CdS under various conditions have been found to have the same properties as those deposited onto glass substrates in previous studies. The amount of sputtering that is required in order to deposit the Cu/sub 2/S heterojunction layer is small compared to that requird to achieve steady state conditions in the deposition apparatus. Thus pre-conditioning is required. The results of experiments that examines various conditioning procedures are reported.
Research Organization:
Solar Energy Research Inst., Golden, CO (USA)
DOE Contract Number:
EG-77-C-01-4042
OSTI ID:
5276979
Report Number(s):
DSE-4042-T19
Country of Publication:
United States
Language:
English