Study of Nb-based Josephson tunnel junctions

Journal Article · Fri Aug 01 04:00:00 EDT 1980 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.328250· OSTI ID:5250534

Matsuda, A; Inamura, T; Yoshikiyo, H

Nb-based Josephson junctions are photographically fabricated with an improved lift-off method. Aging properties of Nb/Pb junctions are studied and the possible origin of aging was pointed out, using the shape dependence and I/sub J/-H characteristics. The I-V characteristics of Nb/Pb junctions were analyzed quantitatively using a proximity effect model based on McMillan's tunneling model. Maximum Josephson current was calculated incorporating the strong coupling correction. Theory and experiment agreed well for both pair and quasiparticle density of states.

• Research Organization: The Electrical Communication Laboratories, Nippon Telegraph and Telephone Public Corporation, Musashino-shi, Tokyo 180, Japan
• OSTI ID: 5250534
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 51:8; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
AGING
ALLOYS
CURRENTS
DATA
ELECTRIC CURRENTS
ELECTRIC POTENTIAL
ELEMENTS
ENERGY-LEVEL DENSITY
EXPERIMENTAL DATA
FABRICATION
INFORMATION
JOSEPHSON JUNCTIONS
LEAD ALLOYS
MATHEMATICAL MODELS
METALS
NIOBIUM
NUMERICAL DATA
REFRACTORY METALS
SUPERCONDUCTING JUNCTIONS
TRANSITION ELEMENTS
TUNNEL EFFECT