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A scanning tunneling microscopy study of clean and Cs-covered InSb(110)

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
DOI:https://doi.org/10.1116/1.585508· OSTI ID:5228501
; ; ;  [1]
  1. National Inst. of Standards and Technology, Gaithersburg, MD (United States)

This paper describes a scanning tunneling microscopy study of clean and Cs-covered InSb(110) surfaces. Atomic-resolution images of both the filled and empty electronic state densities have been obtained. The surface relaxation determined from these images is in good agreement with that predicted by structure calculations. A variety of surface defects have been observed, with the most common appearing to be simple Sb vacancies. Adjacent In and Sb vacancies (Schottky defects) have also been observed. The perturbation of the surface surrounding these defects is asymmetrical along (001), as might be expected due to the asymmetry in the surface. Surprisingly, the perturbation is also asymmetrical along (1{bar 1}0), where symmetry is expected. Cs adsorbed on room-temperature InSb(110) forms one-dimensional zig-zag chains along (1{bar 1}0), similar to those previously observed on GaAs(110).

OSTI ID:
5228501
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 9:2; ISSN 0734-211X; ISSN JVTBD
Country of Publication:
United States
Language:
English