X-ray/EUV optics for astronomy and microscopy
Conference
·
OSTI ID:5204773
The proceedings of this book are organized under the following headings: X-Ray/EUV zone plates, filters, and windows; X-Ray/EUV microscopes, telescopes, and monochromators; Design, characterization and test of multilayer optics; Fabrication of x-ray/EUV multilayer optics; Design, characterization, and test of grazing incidence x-ray optics; Fabrication of grazing incidence x-ray optics; X-ray/EUV space observations and missions; Test and calibration of x-ray/EUV instruments; X-ray polarimetry; X-ray/EUV spectroscopy and instruments.
- OSTI ID:
- 5204773
- Report Number(s):
- CONF-890836--
- Country of Publication:
- United States
- Language:
- English
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Development of the water window imaging x-ray microscope utilizing normal-incidence multilayer optics
Conference
·
Sat Dec 31 23:00:00 EST 1988
·
OSTI ID:6317287
X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography; Proceedings of the Meeting, San Diego, CA, July 9-13, 1990
Conference
·
Mon Dec 31 23:00:00 EST 1990
·
OSTI ID:5408161
Development of the water window imaging x-ray microscope utilizing normal-incidence multilayer optics
Journal Article
·
Thu Aug 01 00:00:00 EDT 1991
· Optical Engineering; (United States)
·
OSTI ID:7108275
Related Subjects
440100 -- Radiation Instrumentation
440600* -- Optical Instrumentation-- (1990-)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
47 OTHER INSTRUMENTATION
ABSTRACTS
BEAM OPTICS
BRAGG REFLECTION
CARBIDES
CARBON COMPOUNDS
COSMIC RAY SOURCES
COSMIC X-RAY SOURCES
DESIGN
DIFFRACTION GRATINGS
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON EMISSION
EMISSION
EXTREME ULTRAVIOLET RADIATION
GRATINGS
LEADING ABSTRACT
MATERIALS TESTING
MEASURING INSTRUMENTS
MEETINGS
MIRRORS
MONOCHROMATORS
OPTICAL PROPERTIES
PHOTOELECTRIC EMISSION
PHYSICAL PROPERTIES
POLARIMETERS
POSITION SENSITIVE DETECTORS
PROPORTIONAL COUNTERS
RADIATION DETECTORS
RADIATIONS
REFLECTION
REFRACTORY METAL COMPOUNDS
SPECTROMETERS
TELESCOPES
TESTING
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN CARBIDES
TUNGSTEN COMPOUNDS
ULTRAVIOLET RADIATION
440600* -- Optical Instrumentation-- (1990-)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
47 OTHER INSTRUMENTATION
ABSTRACTS
BEAM OPTICS
BRAGG REFLECTION
CARBIDES
CARBON COMPOUNDS
COSMIC RAY SOURCES
COSMIC X-RAY SOURCES
DESIGN
DIFFRACTION GRATINGS
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
ELECTRON EMISSION
EMISSION
EXTREME ULTRAVIOLET RADIATION
GRATINGS
LEADING ABSTRACT
MATERIALS TESTING
MEASURING INSTRUMENTS
MEETINGS
MIRRORS
MONOCHROMATORS
OPTICAL PROPERTIES
PHOTOELECTRIC EMISSION
PHYSICAL PROPERTIES
POLARIMETERS
POSITION SENSITIVE DETECTORS
PROPORTIONAL COUNTERS
RADIATION DETECTORS
RADIATIONS
REFLECTION
REFRACTORY METAL COMPOUNDS
SPECTROMETERS
TELESCOPES
TESTING
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN CARBIDES
TUNGSTEN COMPOUNDS
ULTRAVIOLET RADIATION