X-ray/EUV optics for astronomy, microscopy, polarimetry, and projection lithography; Proceedings of the Meeting, San Diego, CA, July 9-13, 1990
Conference
·
OSTI ID:5408161
Topics discussed in this issue include the fabrication of multilayer X-ray/EUV coatings; the design, characterization, and test of multilayer X-ray/EUV coatings; multilayer X-ray/EUV monochromators and imaging microscopes; X-ray/EUV telescopes; the test and calibration performance of X-ray/EUV instruments; XUV/soft X-ray projection lithography; X-ray/EUV space observatories and missions; X-ray/EUV telescopes for solar research; X-ray/EUV polarimetry; X-ray/EUV spectrographs; and X-ray/EUV filters and gratings. Papers are presented on the deposition-controlled uniformity of multilayer mirrors, interfaces in Mo/Si multilayers, the design and analysis of an aspherical multilayer imaging X-ray microscope, recent developments in the production of thin X-ray reflecting foils, and the ultraprecise scanning technology. Consideration is also given to an active sun telescope array, the fabrication and performance at 1.33 nm of a 0.24-micron-period multilayer grating, a cylindrical proportional counter for X-ray polarimetry, and the design and analysis of the reflection grating arrays for the X-Ray Multi-Mirror Mission.
- Research Organization:
- National Aeronautics and Space Administration, Huntsville, AL (United States). George C. Marshall Space Flight Center
- OSTI ID:
- 5408161
- Report Number(s):
- CONF-9007157--; ISBN: 0-8194-0404-7
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440800* -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ABSTRACTS
ASTRONOMY
COATINGS
DESIGN
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
EXTREME ULTRAVIOLET RADIATION
FABRICATION
FILTERS
IONIZING RADIATIONS
LEADING ABSTRACT
MAIN SEQUENCE STARS
MEASURING INSTRUMENTS
MEETINGS
MICROSCOPES
MICROSCOPY
MIRRORS
OPTICAL FILTERS
OPTICS
PERFORMANCE
POLARIMETRY
RADIATIONS
STARS
SUN
TELESCOPES
ULTRAVIOLET RADIATION
X RADIATION
47 OTHER INSTRUMENTATION
ABSTRACTS
ASTRONOMY
COATINGS
DESIGN
DOCUMENT TYPES
ELECTROMAGNETIC RADIATION
EXTREME ULTRAVIOLET RADIATION
FABRICATION
FILTERS
IONIZING RADIATIONS
LEADING ABSTRACT
MAIN SEQUENCE STARS
MEASURING INSTRUMENTS
MEETINGS
MICROSCOPES
MICROSCOPY
MIRRORS
OPTICAL FILTERS
OPTICS
PERFORMANCE
POLARIMETRY
RADIATIONS
STARS
SUN
TELESCOPES
ULTRAVIOLET RADIATION
X RADIATION