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Linewidth measurements of a (GaAl)As diode laser with a high reflectivity coating

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.94748· OSTI ID:5179656
The effect of the facet reflectivity on the linewidth of a single-frequency (GaAl)As diode laser has been studied by measuring the linewidth as a function of the laser output power before and after a high reflectivity coating was applied to one facet of the laser. The observed linewidth reduction arising from the increase in the cavity Q agrees with predictions of linewidth theories. The results indicate that the application of high reflectivity coatings can be a practical method for achieving a substantial reduction of the linewidth of (GaAl)As diode lasers.
Research Organization:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02173-0073
OSTI ID:
5179656
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 44:3; ISSN APPLA
Country of Publication:
United States
Language:
English