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CMOS (complementary metal-oxide semiconductor) design for radiation hardness in digital applications

Conference · · Transactions of the American Nuclear Society; (USA)
OSTI ID:5168488

Processing and, to a lesser degree, circuit innovations discussed herein have permitted a steady improvement in the radiation hardness of digital complementary metal-oxide semiconductor (CMOS) integrated circuits from the mid-1970s to the present. The strides made in hardening CMOS for digital applications may be outstripping the designer's capability for exploitation as circuit complexities increase. Tools providing significant productivity enhancement can be adapted for use in circuit design for radiation hardness.

OSTI ID:
5168488
Report Number(s):
CONF-890604--
Journal Information:
Transactions of the American Nuclear Society; (USA), Journal Name: Transactions of the American Nuclear Society; (USA) Vol. 59; ISSN TANSA; ISSN 0003-018X
Country of Publication:
United States
Language:
English