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Low threshold 1. 51. mu. m InGaAsP buried crescent injection lasers with semi-insulating current confinement layer

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.97339· OSTI ID:5137622

A hybrid growth technique has been used to fabricate low threshold 1.51 ..mu..m InGaAsP buried crescent injection lasers with a semi-insulating current confinement layer. The technique involves a first stage of low pressure metalorganic chemical vapor deposition followed by a liquid phase epitaxy stage. The lasers exhibit cw threshold currents as low as 12 mA at 25 /sup 0/C, high yield, differential quantum efficiency over 41%, and output power more than 18 mW. Small-signal modulation response to 3.5 GHz has been obtained. The lasers show an initial small degradation rate of 1%/kh at 50 /sup 0/C which gives an estimated operating lifetime of 47 years at 25 /sup 0/C.

Research Organization:
Rockwell International Corporation, Collins Transmission System Division, Dallas, Texas 75207
OSTI ID:
5137622
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 49:21; ISSN APPLA
Country of Publication:
United States
Language:
English