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Studies of the n-GaAs/KOH-Se sub 2 sup 2 minus -Se sup 2 minus semiconductor/liquid junction

Journal Article · · Journal of Physical Chemistry; (USA)
DOI:https://doi.org/10.1021/j100345a076· OSTI ID:5111346
; ; ;  [1]
  1. California Institute of Technology, Pasadena (USA)
The current-voltage characteristics of the n-GaAs/KOH-Se{sub 2}{sup 2{minus}}-Se{sup 2{minus}} semiconductor/liquid junction have been determined for a variety of conditions, including changes in the majority carrier density, the minority carrier diffusion length, and the incident light intensity. These data provide an experimental test of previous digital simulation calculations and provide necessary data for use in further mechanistic studies of this system. Spectral response measurements have been performed to elucidate the anomalous increase in short circuit photocurrent density when the n-GaAs photoanodes, and we have observed solar simulated efficiencies in excess of 16% for Os{sup 3+}-treated n-GaAs photoanodes. Chemisorption of metal ions that yielded beneficial effects of n-GaAs photoanode performance also yielded increased charge-transfer rates at p-GaAs, n{sup +}-GaAs, and Sn-doped In{sub 2}O{sub 3} surfaces.
OSTI ID:
5111346
Journal Information:
Journal of Physical Chemistry; (USA), Journal Name: Journal of Physical Chemistry; (USA) Vol. 93:8; ISSN 0022-3654; ISSN JPCHA
Country of Publication:
United States
Language:
English